The gks100 series springloaded contact probes are engineered for high speed, reliable pcb testing ingun applications. They deliver stable contact force and long life in automated fixture environments.
Design teams rely on this series to reduce test uncertainty and improve probe lifetime when validating dense layouts under production conditions.
| Model | Spring Force Range | Max Current | Contact Resistance |
|---|---|---|---|
| GK S100-A | 300–500 gf | 2 A | 15 mΩ typ |
| GK S100-B | 400–700 gf | 3 A | 12 mΩ typ |
| GK S100-C | 500–900 gf | 5 A | 10 mΩ typ |
| GK S100-D | 600–1000 gf | 8 A | 9 mΩ typ |
Robust Contact Design For High Speed Testing
The gks100 series uses a torsion spring mechanism to maintain consistent normal force despite board warp or probe height variation. This design minimizes contact noise and reduces the risk of false rejects during in gun test sequences.
Critical dimensions are held to tight tolerances, ensuring repeatable insertion into test points and stable conductivity across the test cycle.
Optimized For In Gun Probe Applications
Inside in gun fixtures, the gks100 series balances compact size with high reliability. The arrangement supports dense board layouts while keeping alignment forces within mechanical limits.
Fixture designers benefit from standardized footprints and modular configurations that simplify changeovers between product generations.
Material Selection And Durability
Beams and contacts combine palladium alloyed tips with beryllium copper springs to resist wear and preserve signal integrity. This material pairing targets both electrical performance and mechanical longevity.
Surface passivation further protects against oxidation, which is essential for low resistance paths in fine pitch test applications.
Performance Across Test Conditions
Under varying temperature and humidity conditions, the gks100 series maintains stable contact characteristics. This stability supports consistent test results whether the fixture operates in lab or high volume lines.
Signal path inductance is minimized through compact layouts, helping preserve rise times for high frequency board testing.
Key Takeaways For Production Deployment
- Validate spring force against board thickness and test point pullout requirements.
- Confirm current ratings align with device under test power paths to avoid thermal drift.
- Check compatibility with existing in gun fixture housings and alignment features.
- Implement scheduled inspections and cleaning to maintain low contact resistance over time.
FAQ
Reader questions
Can the gks100 series handle boards with warped surfaces in gun fixtures?
Yes, the springloaded mechanism compensates for surface variation by adjusting contact force while retaining stable engagement.
What current capacity should I select for power integrity validation on dense boards?
Choose the GK S100-D model for up to 8 A per probe, which supports higher power traces while preserving low contact resistance.
How does contact resistance affect overall test accuracy in automated in gun systems?
Lower contact resistance reduces voltage drop and measurement noise, improving accuracy for low voltage and high speed signals.
Are there specific cleaning procedures to extend lifetime of the gks100 series probes?
Use nonabrasive swabs and compatible solvents, avoid harsh acids, and inspect tips periodically to preserve consistent spring performance.